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Through Silicon Vias

Through-Silicon Via (TSV) is the newest advancement in chip design that enables Moore's Law of chip scaling. TSV structures connect multiple layers of stacked integrated circuits or 3D chips to deliver better performance, more functionality and smaller packaging of chips while consuming less power. CMC has worked closely with leading edge customers to develop a platform of slurries to enable TSV technology. This platform of slurries include front side slurries for copper & barrier CMP and backside slurries for silicon & oxide/polymer CMP.

Click on one of our products below to learn more.

Frontside    

Backside  

 CMC EPOCH TSVB1000

CMC_TSV_C1000_for_Copper CMC_TSV_S1000_for_Silicon